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All fields Title Creator / Publisher Keyword Year AND OR AND NOT All fields Title Creator / Publisher Keyword Year AND OR AND NOT All fields Title Creator / Publisher Keyword Year AND OR AND NOT All fields Title Creator / Publisher Keyword Year AND OR AND NOT All fields Title Creator / Publisher Keyword Year Sort by creator [A → Z]' creator [Z → A]' publishing year ↑ (asc)' publishing year ↓ (desc)' title [A → Z]' title [Z → A]' Simple Search Hits 1 – 5 of 5 1 TOETS: Work Package 1 Cauvet, Philippe; Potin, Olivier; Flottes, Marie-Lise... In: The European Nanoelectronics Forum 2011 ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00653039 ; The European Nanoelectronics Forum 2011, Nov 2011, Dublin, Ireland. 2011 ; http://www.catrene.org/web/forum2011/ (2011) BASE Show details 2 Wireless Wafer Test for Iterative Testing During System Assembly Noun, Ziad; Cauvet, Philippe; Flottes, Marie-Lise... In: 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537849 ; 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, Texas, United States. 1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010 ; http://www.ieee-tttc.org/ebshistory/2010/2010-06-14%203D-Test10%20CfP.html (2010) BASE Show details 3 System and Method for Wirelessly Testing Integrated Circuits Andreu, David; Cauvet, Philippe; Flottes, Marie-Lise... In: https://hal-lirmm.ccsd.cnrs.fr/lirmm-00767777 ; Spain, Patent n° : EP 08290891 WO 2010031879 (A1). 2008, pp.N/A (2008) BASE Show details 4 Wireless Test Structure for Integrated Systems Noun, Ziad; Cauvet, Philippe; Flottes, Marie-Lise... In: ITC'2008: International Test Conference ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00375077 ; ITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.N/A, 2008, ⟨10.1109/TEST.2008.4700704⟩ (2008) BASE Show details 5 Power Supply Investigation for Wireless Wafer Test Noun, Ziad; Cauvet, Philippe; Flottes, Marie-Lise... In: LATW'08: 9th Latin-American Test Workshop ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-00260205 ; LATW'08: 9th Latin-American Test Workshop, Mar 2008, Puebla, Mexico. pp.165-170 (2008) BASE Show details

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